Laboratory NANOMEC

Microstructural Analysis


X-ray computer-assisted 3D nanotomography scanner (Nanotom, Phoenix)

For three-dimensional visualization and quantitative analysis of microstructural features in a wide variety of materials ranging from metal powders and minerals to polymers and biomaterials. The scanner combines a 160 KV X-ray source to study highly absorbing materials together with a nanofocus tube to provide high resolution (0.2-0.3 µm detail detectability).

Scanning electron microscope (EVO MA15, Zeiss)

With chemical microanalysis EDS Oxford INCA 350, with automated pressure regulation from 10 to 400 Pa to work with non-metallic samples without the need of metalizing.

FIB-FEGSEM dual-beam microscope (Helios NanoLab 600i, FEI)

Fully equipped with STEM detector, X-Ray microanalysis (EDS) and electron backscatter diffraction (EBSD) for 3-D microstructural, chemical and crystallographic orientation analysis. The system is also suited for site-specific TEM sample preparation, micro machining and patterning by ion-beam milling.

Atomic Force Microscope (Park XE150)

To carry out nanoscale characterization of materials, including non-contact and contact atomic force microscopy. Additional features include magnetic microscopy, thermal microscopy, nanolithography and a high temperature stage to carry out measurements up to 250ºC.

Mechanical Properties


Nanoindentation system (TI950, Hysitron)

To perform instrumented nanoindentation, as well as other nanomechanical testing studies, such as micropillar compression in a range of materials, including tests at temperatures up to 500 ºC. The capabilities include nanoindentation with several loading heads tailored for different applications (maximum load resolution, 1 nN), dynamic measurements, scratch and wear testing and SPM imaging and modulus mapping performed with the same indenter tip.

In-situ nanoindenter to carry out elevated temperature mechanical testing inside a SEM

Nanoindenter stage to carry out mechanical tests inside a scanning electron microscope (SEM) for the in-situ observation of the deformation mechanisms. The stage allows the simultaneous acquisition of the load-displacement record and the SEM images during mechanical testing (nanoindentation, micro-compression, micro-bending, micro-tension) of micrometer and sub-micrometer size volumes, including elevated temperature testing.

Micromechanical testing stages (Kammrath and Weiss)

To observe the specimen surface upon loading under light, scanning electron, focused ion-beam, scanning ultrasonic, or atomic force microscopy. Two stages prepared for tension/compression and fibre tensile testing are available, with maximum loads of 10 kN and 1 N, respectively.

Mechanical stage for in-situ testing in X-ray tomography (μTM, IMDEA Materials Institute)

To carry out in-situ mechanical tests under X-ray radiation in computer assisted tomography systems. The stage, designed and developed in-house, can be used both at synchrotron radiation facilities and inside laboratory tomography systems, for the investigation of the damage initiation and propagation in a wide variety of materials.

High Temperature Nanoindentation system (Nanotest Vantage, Micro Materials)

This instrument allows nanoindentation to be carried out at temperatures up to 750°C, and also in inert environments. The instrument uses both tip and sample heating, ensuring stability for long duration testing, including creep tests. This is the first dedicated high temperature nanoindentation instrument in Spain.